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Radiation hardening
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51	TEMPORALLY REDUNDANT LATCH FOR PREVENTING SINGLE EVENT DISRUPTIONS IN SEQUENTIAL INTEGRATED CIRCUITS Dr. David G. Mavis Paul H. Eaton Add to Reading List Source URL: klabs.org Language: English - Date: 2009-01-19 23:25:20 Electromagnetism Computer memory Integrated circuits Logic families Single event upset Flip-flop Radiation hardening Dynamic voltage scaling CMOS Electronic engineering Electronics Digital electronics
52	Source of Acquisition NASA Johnson Space Center The Ionizing Radiation Environmenton the International Space Station: o ~ Avionics a nce vs. E x p e c ~ t i for Add to Reading List Source URL: www.iss-casis.org Language: English - Date: 2014-02-23 13:22:45 Human spaceflight Radiobiology Space science Manned spacecraft Health threat from cosmic rays Radiation protection Single event upset Radiation hardening Ionizing radiation Spaceflight Physics Space
53	QUANTIFICATION OF PHENOMENA OBSERVED DURING A SINGLE EVENT UPSET TEST ON A RECOVERABLE FLIGHT CONTROL COMPUTER Matthew A. Ferguson, Undergraduate Student, Old Dominion University, Norfolk, VA Advisor: Linda Vahala, Ph.D. Add to Reading List Source URL: vsgc.odu.edu Language: English - Date: 2007-09-17 12:12:48 Neutron Particle physics Exotic matter Radiation hardening Spallation Neutron scattering Soft error S-process Neutrino Physics Nuclear physics Nuclear technology
54	Microsoft PowerPoint - Cressler SiGe cryo Electronics KISS[removed]Compatibility Mode] Add to Reading List Source URL: www.kiss.caltech.edu Language: English - Date: 2010-05-26 12:17:31 Electromagnetism Logic families Digital electronics CMOS Electronic design Bipolar junction transistor Radiation hardening Silicon-germanium Field-effect transistor Electronic engineering Integrated circuits Electronics
55	Radiation effects on space electronics Jan Kenneth Bekkeng, University of Oslo - Department of Physics Background Add to Reading List Source URL: www.uio.no Language: English Plasma physics Cosmic rays Radioactivity Spaceflight Van Allen radiation belt Health threat from cosmic rays Radiation hardening Ionizing radiation Radiation Physics Astrophysics Space plasmas
56	COUNCIL ON IONIZING RADIATION MEASUREMENTS AND STANDARDS (CIRMS) REPORT ON Add to Reading List Source URL: www.cirms.org Language: English - Date: 2012-03-15 20:11:19 Radiation Radioactivity Nuclear physics Medical physics Ionizing radiation Radiation protection Background radiation Dosimetry Radiation hardening Physics Radiobiology Medicine
57	NRA 02-OSS-04; Awarded May 2003 Flight Investigations •Cosmic Radiation Environment Dosimetry and Charging Experiment (CREDANCE)/QinetiQ/Clive Dyer –Correlative Environment Monitor (CEM) Add to Reading List Source URL: lws-set.gsfc.nasa.gov Language: English - Date: 2010-06-16 11:52:55 Medical physics Radioactivity Radiation oncology Spaceflight Radiation hardening Absorbed dose Dosimetry Radiation therapy Ionizing radiation Medicine Radiobiology Physics
58	ANNOUNCEMENT and FIRST CALL FOR PAPERS 2015 IEEE NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE Short Course and Radiation Effects Data Workshop July[removed], 2015 Marriott Copley Place Add to Reading List Source URL: www.nsrec.com Language: English - Date: 2014-07-21 07:21:04 Electronics International nongovernmental organizations Radiobiology Radiation effects Electronics manufacturing Radiation hardening Institute of Electrical and Electronics Engineers IEEE Nuclear and Plasma Sciences Society Soft error Electronic engineering Physics Digital electronics
59	DYNAMIC TESTING FOR RADIATION INDUCED FAILURES IN A STANDARD CMOS SUBMICRON TECHNOLOGY PIXEL FRONT-END1 D. De Venuto, F. Corsi°, member IEEE , M. J. Ohletz^, member IEEE Dipartimento di Elettrotecnica ed Elettronica Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 1999-10-17 21:34:03 Integrated circuits Digital electronics Electronic design Electronic circuits Comparator Detectors Radiation hardening Flip-flop CMOS Electronic engineering Electronics Electromagnetism
60	Proceedings of the Int'l Safeguards Workshop: Design and Testi Add to Reading List Source URL: www.bnl.gov Language: English - Date: 2011-09-06 08:42:29 Engineering International Atomic Energy Agency Nuclear proliferation Reliability engineering Radiation hardening Single event upset Soft error Ionizing radiation Instrumentation Technology Digital electronics Electronic engineering